Haekal J, Mu’min R. Structured Defect Data-Based K-Means Clustering Analysis and Framework for Quality Control (QC) Prioritization in Manufacturing. Pasti [Internet]. 2025 Dec. 31 [cited 2026 May 29];18(3):405-16. Available from: https://training-ojs3-publikasi.mercubuana.ac.id/index.php/pasti/article/view/32472